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Design for Manufacturability and Yield for Nano- Scale CMOS

by Chiang (Charles C); Kawa (Jamil)
Published by : Springer (India) Pvt Ltd, New Delhi. ISBN:9788184892444.
Subject(s): VLSI Design
Year: 27
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Item type Current location Call number Status Notes Date due Barcode
Books Books Kumaraguru College of Technology
621.38.06VLSI CHI (Browse shelf) Available MBA 70300

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