000 00594nam a2200277Ia 4500
008 181205s9999 xx 000 0 und d
020 _a81-317-0182-4
041 _aENGLISH
082 _a621.08 BEN
100 _aBentley (John P)
100 _eAUTHOR
245 0 _aPrinciples of Measurement Systems
250 _a3
260 _c2006
300 _bPaper
300 _ePaper Pack
300 _gNO
365 _b0
365 _b275
365 _d1
504 _a22.5
520 _aEngineering Metrology
650 _aEngineering Metrology
942 _cBK
999 _c44756
_d44756