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008 181205s9999 xx 000 0 und d
041 _aENGLISH
082 _a621.382 RUN
100 _aRunyan
100 _eAUTHOR
245 0 _aSemiconductor Measurement and Instrument
260 _c0
300 _bPaper
300 _eHard Binding
300 _gNO
365 _b0
365 _b112.2
365 _d1
504 _a10
520 _aSemiconductor Devices
650 _aSemiconductor Devices
942 _cBK
999 _c824
_d824